Chegal, W. : rechercher sur Z-Library

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1

Long-term stability of cell micropatterns on poly((3-(methacryloylamino)propyl)-dimethyl(3-sulfopropyl)ammonium hydroxide)-patterned silicon oxide surfaces

Woo Kyung Cho, Bokyung Kong, Hyung Ju Park, Jinkyu Kim, Won Chegal, Joon Sig Choi, Insung S. Choi

Journal:

Année:

2010

Langue:

english

Fichier:

PDF, 1.25 MB

english, 2010

2

Highly accurate film thickness measurement based on automatic fringe analysis

D.G. Abdelsalam, Byung Joon Baek, F. Abdel-Aziz, Won Chegal, Daesuk Kim

Journal:

Optik - International Journal for Light and Electron Optics

Année:

2012

Langue:

english

Fichier:

PDF, 1.07 MB

english, 2012

3

Snapshot phase sensitive scatterometry based on double-channel spectral carrier frequency concept

Magnusson, Robert, Cho, Yong Jai, Chegal, Won, Cho, Hyun Mo, Kim, Daesuk, Kim, Hyunsuk

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 1.15 MB

english, 2011

4

Fourier analysis for rotating-element ellipsometers

Chegal, Won, Cho, Hyun Mo, Cho, Yong Jai

Journal:

Année:

2011

Langue:

english

Fichier:

PDF, 312 KB

english, 2011

5

An ellipsometric data acquisition method for thin film thickness measurement in real time

Ye, Sang-Heon, Kim, Soo Hyun, Kwak, Yoon Keun, Cho, Hyun Mo, Cho, Yong Jai, Chegal, Won

Journal:

Measurement Science and Technology

Année:

2008

Langue:

english

Fichier:

PDF, 321 KB

english, 2008

6

Protein quantification on dendrimer-activated surfaces by using time-of-flight secondary ion mass spectrometry and principal component regression

Young-Pil Kim, Mi-Young Hong, Hyun Kyong Shon, Won Chegal, Hyun Mo Cho, Dae Won Moon, Hak-Sung Kim, Tae Geol Lee

Journal:

Applied Surface Science

Année:

2008

Langue:

english

Fichier:

PDF, 248 KB

english, 2008

7

Angle-resolved annular data acquisition method for microellipsometry

Ye, Sang-Heon, Kim, Soo Hyun, Kwak, Yoon Keun, Cho, Hyun Mo, Cho, Yong Jai, Chegal, Won

Journal:

Année:

2007

Langue:

english

Fichier:

PDF, 808 KB

english, 2007

8

Study of Cell-Matrix Adhesion Dynamics Using Surface Plasmon Resonance Imaging Ellipsometry

Kim, Se-Hwa, Chegal, Won, Doh, Junsang, Cho, Hyun Mo, Moon, Dae Won

Journal:

Biophysical Journal

Année:

2011

Langue:

english

Fichier:

PDF, 1.14 MB

english, 2011

9

SPIE Proceedings [SPIE SPIE NanoScience + Engineering - San Diego, California (Sunday 21 August 2011)] Biosensing and Nanomedicine IV - Kinetic analysis of biomolecular interactions by surface plasmon enhanced ellipsometry

Cho, Hyun Mo, Chegal, Won, Cho, Yong Jai, Won, Jong Myoung, Lee, Hak Min, Jo, Jae Heung, Mohseni, Hooman, Agahi, Massoud H., Razeghi, Manijeh

Année:

2011

Langue:

english

Fichier:

PDF, 542 KB

english, 2011

10

CHARACTERIZATION OF TRIS (8-HYDROXYQUINOLINE) ALUMINUM (Alq 3 ) FILM USING SPECTROSCOPIC ELLIPSOMETRY

CHO, YONG JAI, KIM, HYUN JONG, CHEGAL, WON, CHO, HYUN MO, BAEK, UN BONG, NAHM, SEUNG HOON, LEE, JEONG-IK, CHU, HYE YONG

Journal:

International Journal of Modern Physics B

Année:

2006

Langue:

english

Fichier:

PDF, 328 KB

english, 2006

11

Highly-ordered self-assembled monolayer of alkanethiol on thermally annealed polycrystalline gold films

Hong, Young-Kyu, Yu, Hyunung, Lee, Tae Geol, Lee, Noah, Bahng, Jae Ho, Song, Nam Woong, Chegal, Won, Shon, Hyun Kyong, Koo, Ja-Yong

Journal:

Chemical Physics

Année:

2014

Langue:

english

Fichier:

PDF, 1.39 MB

english, 2014

12

Solution immersed silicon (SIS)-based biosensors: a new approach in biosensing

Diware, M. S., Cho, H. M., Chegal, W., Cho, Y. J., Jo, J. H., O, S. W., Paek, S. H., Yoon, Y. H., Kim, D.

Journal:

The Analyst (Royal Society of Chemistry)

Année:

2015

Langue:

english

Fichier:

PDF, 1.01 MB

english, 2015

13

[AIP CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY: 2003 International Conference on Characterization and Metrology for ULSI Technology - Austin, Texas (USA) (24-28 March 2003)] AIP Conference Proceedings - One-dimensional Spectroscopic Measurement of Patterned Structures Using a Custom-built Spectral Imaging Ellipsometer

Année:

2003

Fichier:

PDF, 362 KB

2003

14

[AIP CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS: 2007 International Conference on Frontiers of Characterization and Metrology - Gaithersburg, MD (27-29 March 2007)] AIP Conference Proceedings - Development of a Focused-Beam Ellipsometer Based on a New Principle

Ye, Sang-Heon, Kwak, Yoon Keun, Kim, Soo Hyun, Cho, Hyun Mo, Cho, Yong Jai, Chegal, Won, Seiler, David G., Diebold, Alain C., McDonald, Robert, Garner, C. Michael, Herr, Dan, Khosla, Rajinder P., Secu

Année:

2007

Langue:

english

Fichier:

PDF, 1.47 MB

english, 2007

15

A New Spectral Imaging Ellipsometer for Measuring the Thickness of Patterned Thin Films

W. Chegal, Y. J. Cho, H. J. Kim, H. M. Cho, Y. W. Lee, S. H. Kim

Année:

2004

Langue:

english

Fichier:

PDF, 140 KB

english, 2004

16

Optimizing the precision of a multichannel three-polarizer spectroscopic ellipsometer

Chegal, Won, Lee, Jeong Pyo, Cho, Hyun Mo, Han, Sang-Wook, Cho, Yong Jai

Journal:

Journal of the Optical Society of America A

Année:

2013

Langue:

english

Fichier:

PDF, 1.53 MB

english, 2013

17

Universal evaluations and expressions of measuring uncertainty for rotating-element spectroscopic ellipsometers

Cho, Yong Jai, Chegal, Won, Lee, Jeong Pyo, Cho, Hyun Mo

Journal:

Année:

2015

Langue:

english

Fichier:

PDF, 1.06 MB

english, 2015

18

Calibration of a snapshot phase-resolved polarization-sensitive spectral reflectometer

Kim, Daesuk, Jin, Moonseob, Chegal, Won, Lee, Jaejong, Magnusson, Robert

Journal:

Année:

2013

Langue:

english

Fichier:

PDF, 586 KB

english, 2013

19

Complex object wave direct extraction method in off-axis digital holography

Kim, Daesuk, Magnusson, Robert, Jin, Moonseob, Lee, Jaejong, Chegal, Won

Journal:

Année:

2013

Langue:

english

Fichier:

PDF, 2.45 MB

english, 2013

20

Stokes vector measurement based on snapshot polarization-sensitive spectral interferometry

Kim, Daesuk, Seo, Yoonho, Jin, Moonseob, Yoon, Yonghee, Chegal, Won, Cho, Yong Jae, Cho, Hyun Mo, Abdelsalam, Dahi G., Magnusson, Robert

Journal:

Année:

2014

Langue:

english

Fichier:

PDF, 989 KB

english, 2014

21

Mono-axial power spectrograph for a spectral imaging ellipsometer: design and experimental results

Chegal, Won, Kim, Soohyun, Kwak, Yoon Keun, Cho, Hyunmo, Lee, Yunwoo

Journal:

Measurement Science and Technology

Année:

2003

Langue:

english

Fichier:

PDF, 295 KB

english, 2003

22

Calibration method for rotating-analyser-type spectral imaging ellipsometers

W. Chegal, Y. J. Cho, S. B. Oh, H. M. Cho, Y. W. Lee, S. H. Kim

Année:

2005

Langue:

english

Fichier:

PDF, 308 KB

english, 2005

23

SPIE Proceedings [SPIE Optics East 2005 - Boston, MA (Sunday 23 October 2005)] Nanosensing: Materials and Devices II - Enhancement of biomolecular detection sensitivity by surface plasmon resonance ellipsometry

Cho, Hyun Mo, Chegal, Won, Cho, Yong Jai, Kim, Young-pil, Kim, Hak-sung, Islam, M. Saif, Dutta, Achyut K.

Année:

2005

Langue:

english

Fichier:

PDF, 256 KB

english, 2005

24

SPIE Proceedings [SPIE Optical Engineering for Sensing and Nanotechnology (ICOSN '01) - Yokohama, Japan (Wednesday 6 June 2001)] Optical Engineering for Sensing and Nanotechnology (ICOSN 2001) - In-situ single-wavelength ellipsometer for a vacuum chamber

Chegal, Won, Ye, Sangheon, Cho, Hyun-Mo, Lee, Yoonwoo, Kim, Soo Hyun, Kwak, Yoon Keun, Iwata, Koichi

Année:

2001

Langue:

english

Fichier:

PDF, 103 KB

english, 2001

25

SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Optical Constants of Materials for UV to X-Ray Wavelengths - Determination of optical properties of titanium dioxide thin films on different substrates by using spectroscopic ellipsometry

Kim, Hyun Jong, Cho, Yong Jai, Cho, Hyun Mo, Chegal, Won, Lee, Yun Woo, Kim, Sang Youl, Soufli, Regina, Seely, John F.

Année:

2004

Langue:

english

Fichier:

PDF, 159 KB

english, 2004

26

SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Imaging Spectrometry X - Azimuth calibration method in ellipsometer with imaging spectrograph

Chegal, Won, Cho, Yong Jai, Kim, Hyun Jong, Cho, Hyun Mo, Lee, Yun Woo, Kim, Soo Hyun, Shen, Sylvia S., Lewis, Paul E.

Année:

2004

Langue:

english

Fichier:

PDF, 108 KB

english, 2004

27

SPIE Proceedings [SPIE Photonics Asia 2004 - Beijing, China (Monday 8 November 2004)] Advanced Sensor Systems and Applications II - Fast data acquisition in imaging ellipsometry using four-frame method

Chegal, Won, Rao, Yun-Jiang, Kwon, Osuk Y., Cho, Yong Jai, Cho, Hyun Mo, Peng, Gang-Ding, Lee, Yun Woo, Kim, Soo Hyun

Année:

2004

Langue:

english

Fichier:

PDF, 183 KB

english, 2004

28

SPIE Proceedings [SPIE Optics East 2005 - Boston, MA (Sunday 23 October 2005)] Nanosensing: Materials and Devices II - Imaging ellipsometry combined with surface plasmon resonance for real-time biospecific interaction analysis

Chegal, Won, Islam, M. Saif, Dutta, Achyut K., Cho, Hyun Mo, Cho, Yong Jai, Kim, Young Pil, Kim, Hak Sung

Année:

2005

Langue:

english

Fichier:

PDF, 332 KB

english, 2005

29

SPIE Proceedings [SPIE Optical Engineering for Sensing and Nanotechnology (ICOSN '01) - Yokohama, Japan (Wednesday 6 June 2001)] Optical Engineering for Sensing and Nanotechnology (ICOSN 2001) - Multipoint process monitoring system based on an acousto-optic tunable filter (AOTF)

Kim, Dae S., You, Jang W., Kim, Soo Hyun, Kong, Hong-Jin, Lee, Yun Woo, Chegal, Won, Kwak, Yoon Keun, Iwata, Koichi

Année:

2001

Langue:

english

Fichier:

PDF, 283 KB

english, 2001

30

Ultrasensitive, label-free detection of cardiac biomarkers with optical SIS sensor

Diware, Mangesh S., Cho, Hyun Mo, Chegal, Won, Cho, Yong Jai, Kim, Dong Soo, O, Sang Won, Kim, Kyeong-Suk, Paek, Se-Hwan

Journal:

Biosensors and Bioelectronics

Année:

2017

Langue:

english

Fichier:

PDF, 1.11 MB

english, 2017

31

Dielectric function of polycrystalline α -Ag 2 S by spectroscopic ellipsometry

Diware, M. S., Ganorkar, S. P., Kim, J., Bramhe, S. N., Cho, H. M., Cho, Y. J., Chegal, W.

Journal:

Applied Physics Letters

Année:

2015

Langue:

english

Fichier:

PDF, 2.74 MB

english, 2015

32

Label-free detection of hepatitis B virus using solution immersed silicon sensors

Diware, Mangesh S., Cho, Hyun Mo, Chegal, Won, Cho, Yong Jai, O, Sang Won, Paek, Se-Hwan, Kim, Dong Soo, Kim, Kyeong-Suk, Min, Yoon Gi, Jo, Jae Heung, Shin, ChaeHo

Journal:

Année:

2017

Langue:

english

Fichier:

PDF, 1.85 MB

english, 2017

33

Wafer-scale production of highly uniform two-dimensional MoS 2 by metal-organic chemical vapor deposition

Kim, TaeWan, Mun, Jihun, Park, Hyeji, Joung, DaeHwa, Diware, Mangesh, Won, Chegal, Park, Jonghoo, Jeong, Soo-Hwan, Kang, Sang-Woo

Journal:

Année:

2017

Langue:

english

Fichier:

PDF, 1.08 MB

english, 2017

34

Characterization of wafer-scale MoS 2 and WSe 2 2D films by spectroscopic ellipsometry

Diware, Mangesh S., Park, Kyunam, Mun, Jihun, Park, Han Gyeol, Chegal, Won, Cho, Yong Jai, Cho, Hyun Mo, Park, Jusang, Kim, Hyungjun, Kang, Sang-Woo, Kim, Young Dong

Journal:

Current Applied Physics

Année:

2017

Langue:

english

Fichier:

PDF, 3.04 MB

english, 2017

35

Dielectric function, critical points, and Rydberg exciton series of WSe2 monolayer

Diware, Mangesh, Ganorkar, Shraddha, Park, Kyunam, Chegal, Won, Cho, Hyun Mo, Cho, Yong Jai, Kim, Young Dong, Kim, Hyungjun

Journal:

Journal of Physics Condensed Matter

Année:

2018

Langue:

english

Fichier:

PDF, 1.52 MB

english, 2018

36

Wafer-Scale Epitaxial 1T′, 1T′-2H Mixed, and 2H Phases MoTe 2 Thin Films Grown by Metal-Organic Chemical Vapor Deposition

Kim, TaeWan, Park, Hyeji, Joung, DaeHwa, Kim, DongHwan, Lee, Rochelle, Shin, Chae Ho, Diware, Mangesh, Chegal, Won, Jeong, Soo Hwan, Shin, Jae Cheol, Park, Jonghoo, Kang, Sang-Woo

Journal:

Advanced Materials Interfaces

Année:

2018

Langue:

english

Fichier:

PDF, 2.09 MB

english, 2018

37

Universal evaluation of combined standard uncertainty for rotating-element spectroscopic ellipsometers

Cho, Yong Jai, Chegal, Won, Lee, Jeong Pyo, Cho, Hyun Mo

Journal:

Année:

2016

Langue:

english

Fichier:

PDF, 2.34 MB

english, 2016

38

Interferometric snapshot spectro-ellipsometry

Dembele, Vamara, Jin, Moonseob, Choi, Inho, Chegal, Won, Kim, Daesuk

Journal:

Année:

2018

Langue:

english

Fichier:

PDF, 2.49 MB

english, 2018

39

High-Mobility MoS 2 Directly Grown on Polymer Substrate with Kinetics-Controlled Metalorganic Chemical Vapor Deposition

Mun, Jihun, Park, Hyeji, Park, Jaeseo, Joung, DaeHwa, Lee, Seoung-Ki, Leem, Juyoung, Myoung, Jae-Min, Park, Jonghoo, Jeong, Soo-Hwan, Chegal, Won C., Nam, SungWoo, Kang, Sang-Woo

Journal:

ACS Applied Electronic Materials

Année:

2019

Fichier:

PDF, 2.59 MB

2019

40

Correlation between Ru-O Hybridization and Oxygen Evolution Reaction in Ruthenate Epitaxial Thin Films

Lee, Sang A, Lee, Jegon, Oh, Seokjae, Lee, Suyoun, Bae, Jong Seong, Chegal, Won, Diware, Mangesh S., Park, Sungkyun, Chang, S.H., Choi, Taekjib, Choi, Woo Seok

Journal:

Sustainable Energy Fuels

Année:

2019

Langue:

english

Fichier:

PDF, 1.26 MB

english, 2019

41

Dynamic spectroscopic ellipsometry based on a one-piece polarizing interferometric scheme

Dembele, Vamara, Choi, Sukhyun, Chegal, Won, Choi, Inho, Paul, Madhan Jayakumar., Kim, Junho, Kim, Daesuk

Journal:

Optics Communications

Année:

2020

Langue:

english

Fichier:

PDF, 2.47 MB

english, 2020

42

Normal-incidence type solution immersed silicon (SIS) biosensor for ultra-sensitive, label-free detection of cardiac troponin I

Kim, Dong Hyung, Chegal, Won, Cho, Yong Jai, Won O, Sang, Van Le, Long, Diware, Mangesh S., Paek, Se-Hwan, Kim, Young Dong, Cho, Hyun Mo

Journal:

Biosensors and Bioelectronics

Année:

2020

Fichier:

PDF, 3.54 MB

2020